![]() ![]() ![]() Scattering methods use the diffraction or reflection of radiation or particles by the nanomaterials to determine their crystal structure, phase, and orientation, such as X-ray diffraction (XRD), small-angle X-ray scattering (SAXS), or neutron scattering. Spectroscopy methods use the interaction of electromagnetic radiation or particles with the nanomaterials to identify their elemental or molecular composition, such as X-ray fluorescence (XRF), energy-dispersive X-ray spectroscopy (EDX), Fourier transform infrared spectroscopy (FTIR), or Raman spectroscopy. Microscopy methods use various forms of radiation or probes to image the nanomaterials at different magnifications and resolutions, such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), or scanning tunneling microscopy (STM). There are many characterization methods for nanomaterials, but they can be broadly classified into four main types: microscopy, spectroscopy, scattering, and analysis. ![]()
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